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Scanning Electron Microscopy (SEM) is used to image a sample at high-resolution with a focused beam of electrons.
Supervisors: Ed Meyer
Ed's Phone: (603) 646-1612
We have a Hitachi TM3000 SEM with Bruker EDS.
Sample surface topography and composition can be observed at a magnification up to ~30,000x. Using energy dispersive X-ray spectroscopy (EDS) sample chemistry can be measured with spot sizes of only a few microns.
Schedule SEM time using our Google Calendar (email Ed Meyer for access to this calendar)