Scanning Electron Microscopy (SEM) is used to image a sample with a focused beam of electrons. 

Lab Team

Supervisors:  Ed Meyer

Lab Phone: (603) 646-8937

Ed's Phone: (603) 646-1612



  • Scanning Electron Microscopy - Carleton Guide (PDF)
  • Energy-Dispersive X-Ray Spectroscopy - Carleton Guide (PDF)

About our SEM

Sample surface topography and composition can be observed at a magnification up to ~30,000x. Using Energy dispersive X-ray spectroscopy (EDS) sample chemistry can be measured with spot sizes of only a few microns.

We currently own a Hitachi TM3000 SEM with Bruker EDS.